16th IEEE Latin-American Test Symposium 2015
(LATS2015)
March 25- 27, 2015
Puerto Vallarta, Mexico

http://www.latS.tttc-events.org 

The IEEE Latin-American Test Symposium (LATS, previously Latin-American Test Workshop - LATW) is a recognized forum for test and fault tolerance professionals and technologists from all over the world, in particular from Latin America, to present and discuss various aspects of system, board, and component testing and fault-tolerance with design, manufacturing and field considerations in mind. Presented papers are also published in the IEEE Xplore Digital Library. The best papers of the 16th LATS will be invited to re-submit to the IEEE Design and Test of Computers, IEEE Transactions on Computer-Aided Design, Journal of Electronic Testing: Theory and Applications -JETTA (Springer) and Journal of Low Power Electronics - JOLPE (American Scientific Publishers). 

You are invited to participate and submit your contributions to the LATS2015. Topics of interest include but are not limited to: 

• Analog Mixed Signal Test 
• Economics of Test 
• Memory Test and Repair 
• Automatic Test Generation Fault Analysis and Diagnosis 
• On-Line Testing 
• Built-In Self-Test 
• Fault Modeling and Simulation 
• Process Control and Measurements 
• Defect-Based Test - Fault-Tolerance in HW/SW 
• Radiation/EMI 
• Design and Synthesis for Testability 
• Fault-Tolerant Architectures 
• Software Fault-Tolerance 
• Design for Electromagnetic Compatibility 
• Hardware Trust & Security Approaches 
• Software On-Line Testing 
• Design for Reliable Embedded Software 
• HW-SW Integrity Checking- System-on-Chip Test 
• Design Verification/Validation to Prevent Attacks 
• Yield Optimization 

To encourage and facilitate discussions, participation will be limited. Those interested in presenting recent results at the symposium are invited to submit an extended abstract, one to three pages long, or a full length paper.

PDF electronic submissions should be done via the symposium webpage: www.latS.tttc-events.org. Authors should send papers in the IEEE format. Detailed instructions are available at the symposium webpage. The Program Committee also welcomes proposals for panels and special topic sessions. 

Submission Deadline: November 14th , 2014. 

Notification of Acceptance: December 19th, 2014. 

Camera Ready: January 16th, 2015. 

For additional information, please contact one of the Program Chairs: 

Leticia Maria Bolzani Poehls – Catholic University of Rio Grande do Sul (PUCRS), Brazil

leticia@poehls.com 

 Vishwani Agrawal – Auburn University, United States of America             

 vagrawal@eng.auburn.edu 

General Chairs

• Victor Champac – INAOE, Mexico (champac@inaoep.mx)
• Yervant Zorian – SYNOPSYS, USA (yervant.zorian@synopsys.com)

Program Chairs

• Leticia Bolzani Poehls PUCRS, Brazil 
• Vishwani Agrawal Auburn University, USA 

Past General Chair: 

• Fabian Vargas PUCRS, Brazil 

Local Chairs: 

• José Ernesto Rayas Sánchez – ITESO, Mexico 
• Jose Garcia Gervacio – Univ. of Veracruz, Mexico 

Publication Chair: 

• Maksim Jenihhin – Tallinn Tech. Univ., Estonia 

Panel Chairs: 

• Ramesh Karri – New York University, USA 
• Fernanda Kastensmidt – UFRGS, Brazil 

Publicity Chairs: 

• Ricardo Reis – UFRGS, Brazil 
• Giorgio di Natale – LIRMM, France 
• Hector Villacorta – INAOE, Mexico 

Industry Liaison: 

• Federico Lobato – Freescale, Mexico 

Asia Liaison: 

• Hiroyuki Yamauchi – Fukuoka Inst. of Tech., Japan 

East-Europe Liaison: 

• Raimund Ubar – Tallinn Technical Univ., Estonia 

West-Europe Liaison: 

• Said Hamdioui – Delft University, The Netherlands 

North-America Liaison: 

• Swarup Bhunia – Case Western Reserve Univ., USA Magdy Abadir, USA

 JETTA Liaison: 

• Vishwani D. Agrawal – Auburn University, USA 

JOLPE Liaison: 

• Patrick Girard – LIRMM, France 

TTEP Tutorials Chair: 

• Dimitris Gizopoulos University of Athens, Greece 

TTTC PhD Thesis Contest Organizer: 

• José Lipovetzky – UBA, Argentina 

Technical Program Committee: 

• Alex Orailoglu UCSD, USA
• Andréa Weber UFPR, Brazil 
• Andreas Veneris  University of Toronto, Canada 
• Avelino Zorzo – PUCRS, Brazil 
• Carlos Silva Cardenas – Catholic Univ. of Peru, Peru 
• Celia Lopez Ongil – UC3M, Spain 
• Dhiraj Pradhan – Univ. of Bristol, United Kingdom 
• Djones Lettnin – UFSC, Brazil 
• Emmanuel Simeu TIMA, France 
• Erik Jan Marinissen IMEC, Belgium 
• Frank Sill – UFMG, Brazil 
• Hans Joachim Wunderlich  U. of Stuttgart, Germany 
• Jacob Abraham  Univ. of Texas, USA 
• João Paulo Teixeira  INESC ID / IST, Portugal 
• John P. Hayes – Univ. of Michigan, USA 
• Heinrich Vierhaus – BTU Cottbus, Germany 
• Jesus Moreno, ITESM, Mexico 
• José Pineda de Gyvez – NXP, The Netherlands 
• Julio Perez – UROU, Uruguay 
• Kaushik Roy, Purdue University, USA 
• Luz Suarez Balado – UPC, Spain 
• Mani Soma – Univ. Washington, USA 
• Marcelino Santos INESC, Portugal 
• Marta Portela Garcia Univ. Carlos III, Spain 
• Michel Renovell - LIRMM, France 
• Mohammad Tehranipoor – U. of Connecticut, USA 
• Ozgur Sinanoglu New York Univ., United Arab Emirates 
• Regis Leveugle, TIMA, France 
• Roberto Gomez, Univ. of Sonora, Mexico 
• Sachin Sapatnekar – Univ. of Minnesota, USA 
• Sybille Hellebrand – Univ. of Paderborn, Germany 
• Taisy Silva Weber – UFRGS, Brazil 
• Victor Avendaño - Freescale, Mexico 
• Wang J. Chau – LME / USP, Brazil 
• Xiaoqing Wen - Kyushu Inst. of Technology, Japan 

Steering Committee: 

• Victor Champac 
• Fabian Vargas 
• Marcelo Lubaszewski 
• Raoul Velazco 
• Yervant Zorian 

The 16th IEEE Latin-American Test Symposium  is sponsored by the Institute of Electrical and Electronics Engineers (IEEE) Computer Society's Test Technology Technical Council (TTTC).